J.A. Woollam
J.A. Woollam M-2000 Ellipsometer
Spectroscopic ellipsometer for thin-film characterization
The M-2000 spectroscopic ellipsometer uses Rotating Compensator (RCE) technology with a high-speed CCD detector to capture 700+ wavelengths from UV to near-infrared simultaneously — characterizing film thickness, refractive index, and extinction coefficient of single- or multi-layer stacks.
Specifications
- Type
- Spectroscopic ellipsometer
- Technology
- Rotating Compensator (RCE)
- Spectral range
- UV to near-infrared
- Wavelengths
- 700+ simultaneous
