J.A. Woollam
American manufacturer of spectroscopic ellipsometers for thin-film characterization and optical measurement.
Specifications & options
Spectral range
Measured properties
Wavelengths acquired
Over 1000 simultaneously
Polarization analysis
Full 16-element Mueller matrix
Why choose J.A. Woollam?
Full Mueller matrix
Dual rotating compensators capture all 16 Mueller-matrix elements for complete characterization of anisotropic and depolarizing samples.
Fast spectral acquisition
A CCD detector measures over 1000 wavelengths simultaneously, capturing a full UV-to-NIR spectrum in under a second.
Ultra-thin-film sensitivity
Phase-sensitive ellipsometry resolves films thinner than 10 nm, including self-assembled monolayers.
CompleteEASE software
An intuitive platform handles data acquisition, optical modeling, and reporting across the entire instrument lineup.
Product series
Understand each series to find the right fit for your application.
M-2000
A versatile workhorse spectroscopic ellipsometer using a CCD detector to acquire hundreds of wavelengths at once for fast, accurate thin-film analysis.
RC2
A dual rotating compensator system that captures the complete Mueller matrix from the UV to NIR for the most demanding anisotropic and depolarizing samples.
alpha-SE
A compact, budget-friendly ellipsometer designed for routine measurement of film thickness and refractive index with a simple, easy-to-use interface.
IR-VASE
An infrared variable-angle ellipsometer offering high sensitivity to epitaxial-layer thickness, substrate doping, and interface carrier gradients.
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